Screening, Quality, and Reliability


Screening, Quality, and Reliability


Ordering Information for Optional Screening Requirements for Catalog Parts:


"W" - PIND (Particle Impact Noise Detection)

  • To order PIND testing on standard part numbers, add the suffix "W" to the catalog part number. PIND will be performed in accordance with MIL-STD-750 Method 2052 or MIL-STD-883 Method 2020, as applicable.

"Q" - QCI
  • To order QCI on standard non-JAN qualified standard part numbers, add the suffix “Q” to the catalog part number. When ordered, QCI will be performed in accordance with MIL-STD-883 or MIL-STD-750 depending on product configuration requirements.

"S" - S-100 Screening

  • To order S-100 testing on standard part numbers add the suffix "S" to the catalog part number.



"SS" - SS-100 Screening

  • To order SS-100 testing on standard part numbers,  add the suffix "SS" to the catalog part number. SS discrete space level diodes for commercial space applications, follow the process equivalent to JANS flow from wafer fab thru test.
 
ISO 9001: 2008 and AS9100 3rd Party Registration Certificate (download)