Ordering Information for Optional Screening Requirements for Catalog Parts:

"W" - PIND (Particle Impact Noise Detection)

• To order PIND testing on standard part numbers, add the suffix "W" to the catalog part number. PIND will be performed in accordance with MIL-STD-750 Method 2052 or MIL-STD-883 Method 2020, as applicable.

• To order QCI on standard non-JAN qualified standard part numbers, add the suffix “Q” to the catalog part number. When ordered, QCI will be performed in accordance with MIL-STD-883 or MIL-STD-750 depending on product configuration requirements.

"S" - S-100 Screening

• To order S-100 testing on standard part numbers add the suffix "S" to the catalog part number.

"SS" - SS-100 Screening

• To order SS-100 testing on standard part numbers,  add the suffix "SS" to the catalog part number. SS discrete space level diodes for commercial space applications, follow the process equivalent to JANS flow from wafer fab thru test.

Hi-Reliability/Aerospace Level Screening Flows:

Screening equivalent (S-100)

MIL-PRF-38534 Class H equivalent

MIL-PRF-38535 Class B equivalent

Space Level Screening Flows:

Class S equivalent (SS-100)

MIL-PRF-38534 Class K equivalent

MIL-PRF-38535 Class S equivalent

Screening Procedure for Plastic Encapsulated Transient Voltage Suppressors:

Hi-rel Plastic Encapsulated Screening Procedure for TVS, Datasheet 5429